Program

Here you can download the program overview as a PDF file (In German only)

November 5, 2026

time action author organization title
   
09:30 a.m.  Registration and distribution of conference materials, with welcome coffee
10:00 a.m.  Welcome and Opening Remarks  
        Image Acquisition
10:15 a.m.  Lecture Bernd Jähne Uni Heidelberg-IWR A New Measurement Technique for the Image Sensor MTF and Its Significance for Modern Image Sensors
10:40 a.m.  Lecture Alkhazur Manakov Uni-Heidelberg-HCI/IWR Unified Characterization of Area-Scan, Event-Based, and SPAD Cameras Using EMVA1288-Inspired Quality Metrics
11:05 a.m.  Postersession Bernd Jähne Uni Heidelberg-IWR EMVA 1288 Goes ISO 24942: Copying with the Increasing Importance of Camera Characterization for Vision Applications
  Postersession Tobias Haist Uni Stuttgart-ITO Multipoints – an overview
  Postersession Ömer Atmaca Uni Stuttgart-ITO Comparative analysis of integral transform-based single and few shot fringe image processing algorithms
         
11:20 a.m.  Coffee Break and Poster Presentation  
        Machine Learning and AI
11:40 a.m.  Lecture Anne Sielemann Fraunhofer IOSB Combining the strengths of simulation and generative AI for synthetic image generation
12:05 a.m.  Lecture Tobias Pruß Uni Stuttgart-INM Precise Monocular Ball Localization in 4K through Agentically Generated Synthetic Training Data
12:30 a.m.  Postersession Jonathan Zender HS Kempten-IMS Synthetic Training Data for YOLO-Based Optical 3D Inspection of Fork Welds in Manufacturing
  Postersession Lukas Dippon Fraunhofer IOSB TorchGCvM: Fast Cramér-von-Mises Distance for PyTorch
     
12:40 a.m.  Lunch Break and Poster Presentation  
        Machine Learning and AI
01:40 p.m. Lecture Steven Landgraf KIT-IPF Uncertainty-Guided Dynamic Routing for Cost-Efficient Image Classification
02:05 p.m. Lecture Vincent Wahyudi THWS-FANG Evaluating Multi-View Anomaly Detection for Inspection of Reusable Containers
02:30 p.m. Postersession  Msuega Jnr. Iorpenda THWS-CERI Cascaded Outlier Rejection for Object-specific Monocular Time-to-Collision Estimation
  Postersession Julian Truetsch FZI  Describing Large Image Datasets in Natural Language Using Vision-Language Models for Automated Driving
     
02:40 p.m. Coffee Break and Poster Presentation  
        Robotics and Vehicles
03:00 p.m. Lecture Alexander Braun HS Düsseldorf Optical Quality and Computer Vision Performance: Emerging New Metrics
03:25 p.m. Lecture Niels Rohweder TU Clausthal (SWZ) Camera-based brain-computer interface using the pupillary light reflex with extended frequency range
03:50 p.m. Lecture Jan A. Rudolph KIT-IPF Laser-Tracker-Assisted Camera-to-Robot Calibration for Mobile Robots
       
04:15 p.m. Coffee Break    
        Plenary Lecture
04:35 p.m. Plenary Lecture Michael Salamon Fraunhofer IIS Overview x-ray technologies
05:20 p.m. End of the first day  

 

07:00 p.m. Reception and Evening Event at the Badische Weinstube, Karlsruhe, Germany

November 6, 2026

time action author organization title
         
        Image Processing and Measurement Technology
09:00 a.m.  Lecture Christian Kludt Fraunhofer IOSB Inverse Fringe Patterns for Single Shot Deflectometry
09:25 a.m.  Lecture Annika Bätz KIT LineAP: A Segment-Based Average Precision Metric for Visual Rail Track Detection
09:50 a.m.  Lecture Jannick Ahlvers Fraunhofer IOSB-INA On-camera person localization with omlox integration for safety applications
10:15 a.m.  Lecture Fulco Verheul Mitutoyo Research Center Europe in Best Autofocus-Based Surface Reconstruction in Digital Holography
         
10:40 a.m.  Coffee Break    
        Tutorials
11:10 a.m.  Lecture Tobias Haist Uni Stuttgart-ITO Perspective as a 3D Measurement Method: An Overview
11:35 a.m.  Lecture Bastian Erdnüß Fraunhofer IOSB Tutorial on Hand-Eye Calibration
12:00 a.m.  Lecture Marie Gogolin Fraunhofer ITWM A Brief Overview of Quantum and Quantum-Inspired Approaches for Image Segmentation
       
12:25 a.m.  Lunch Break    
        Quality Assurance
01:25 p.m.  Lecture Erik Trostmann  Fraunhofer IFF Detection of Surface Defects on Free-Form Components
01:50 p.m.  Lecture Marc Schneider Fraunhofer IMS STEP-ID: Computer Vision-Based Part Identification for Post-Production Automation in Additive Manufacturing
02:15 p.m.  Lecture Andreas Heinrich HS Aalen Time-Resolved Refractive Index Formation in DLP-Cured Photopolymers for Micro-Optical Applications
02:40 p.m.  Best Contribution Award, Summary, and Closing Remarkse  
03:00 p.m.  End